Author Details
Тихонов, М. И.
| Issue | Section | Title | File |
| Vol 69, No 2 (2024) | PHYSICAL PROCESSES IN ELECTRONIC DEVICES | Application of tracing tools for analysis of microcontroller failures arising under the 14 MeV neutrons exposure |
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Keywords
ceramics
composite materials
effective permittivity
exact solutions
fractal elements
fractional order elements
gallium arsenide
heterostructure
ideal complex fractal elements
idealized passive element of complex fractional order
induced currents
ionosphere
magnetocaloric effect
magnonics
photonic crystal
power spectral density
reflection coefficient
satellite communication systems
spin waves
stimulated picosecond emission
synthesis
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Keywords
ceramics
composite materials
effective permittivity
exact solutions
fractal elements
fractional order elements
gallium arsenide
heterostructure
ideal complex fractal elements
idealized passive element of complex fractional order
induced currents
ionosphere
magnetocaloric effect
magnonics
photonic crystal
power spectral density
reflection coefficient
satellite communication systems
spin waves
stimulated picosecond emission
synthesis
Information