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Poverhnostʹ. Rentgenovskie, sinhrotronnye i nejtronnye issledovaniâ
ISSN 1028-0960 (Print)
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Keywords X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy channeling electron microscopy ion implantation irradiation magnetron sputtering microstructure nanoparticles neutron reflectometry optical properties phase composition scanning electron microscopy silicon structure surface surface morphology synchrotron radiation thin films zinc oxide
Current Issue

No 3 (2025)

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Keywords X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy channeling electron microscopy ion implantation irradiation magnetron sputtering microstructure nanoparticles neutron reflectometry optical properties phase composition scanning electron microscopy silicon structure surface surface morphology synchrotron radiation thin films zinc oxide
Current Issue

No 3 (2025)

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Home > Search > Author Details

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Поляк, Л. Е.

Issue Section Title File
No 9 (2024) Articles Determination of the ratio of atoms and molecules in a tellurium beam using a mass spectrometer
 

 

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