Optically controlled fine-tuning phase shift cell based on thin-film Ge2Sb2Te5 for light beam phase modulation

Обложка

Цитировать

Полный текст

Открытый доступ Открытый доступ
Доступ закрыт Доступ предоставлен
Доступ закрыт Только для подписчиков

Аннотация

Presented the experimental study of free-space optical control of the optical beam phase shift caused by the formation of a layered structure in an elementary controllable cell made of phase-change material Ge2Sb2Te5 sub jected to the controlling effect of pulsed laser radiation. The phase change of the signal optical beam passing through the controlled cell from phase-change material relative to the control beam in the Jamin interferometer is demonstrated.

Об авторах

A. V Kiselev

National Research Centre “Kurchatov Institute”

Автор, ответственный за переписку.
Email: kiselev.ilit.ras@gmail.com
Shatura, Russia

A. A Nevzorov

National Research Centre “Kurchatov Institute”

Email: kiselev.ilit.ras@gmail.com
Shatura, Russia

A. A Burtsev

National Research Centre “Kurchatov Institute”

Email: kiselev.ilit.ras@gmail.com
Shatura, Russia

V. A Mikhalevsky

National Research Centre “Kurchatov Institute”

Email: kiselev.ilit.ras@gmail.com
Shatura, Russia

N. N Eliseev

National Research Centre “Kurchatov Institute”

Email: kiselev.ilit.ras@gmail.com
Shatura, Russia

V. V Ionin

National Research Centre “Kurchatov Institute”

Email: kiselev.ilit.ras@gmail.com
Shatura, Russia

A. A Lotin

National Research Centre “Kurchatov Institute”

Email: kiselev.ilit.ras@gmail.com
Shatura, Russia

Список литературы

  1. S. Raoux and M. Wutting, Phase change materials. Science and applications, Springer Science + Business Media, N.Y. (2009), 450 p.
  2. A. V. Kolobov and J. Tominaga, Chalcogenides: Metastability and Phase Change Phenomena, SpringerVerlag, Berlin, Heidelberg (2012), 284 p.
  3. S. G. Sarwat, Materials science and Technology 33(16), 1890 (2017).
  4. E. R. Meinders, A. V. Mijiritskii, L. van Pieterson, and M. Wuttig, Optical data storage: Phase-change media and recording, Springer Science & Business Media, Dordrecht, The Netherlands (2006).
  5. A. Redaelli, Phase Change Memory. Device Physics, Reliability and Applications, Springer International, Cham, Switzerland (2018).
  6. T. Cao and M. Cen, Advanced Theory and Simulations 2(8), 1900094 (2019).
  7. P. Guo, A. M. Sarangan, and I. Agha, Appl. Sci. 9(3), 530 (2019).
  8. S. Abdollahramezani, O. Hemmatyar, H. Taghinejad, A. Krasnok, Y. Kiarashinejad, M. Zandehshahvar, A. Alu, and A. Adibi, Nanophotonics 9(5), 1189 (2020).
  9. K. V. Sreekanth, M. ElKabbash, V. Caligiuri, R. Singh, A. De Luca, and G. Strangi, New Directions in Thin Film Nanophotonics, Springer, Singapore (2019).
  10. A. V. Kiselev, V. V. Ionin, A. A. Burtsev, N. N. Eliseev, V. A. Mikhalevsky, N. A. Arkharova, D. N. Khmelenin, and A. A. Lotin, Optics & Laser Technology. 147, 107701 (2022).
  11. K. S. Andrikopoulos, S. N. Yannopoulos, A. V. Kolobov, P. Fons, and J. R. Tominaga, J. Phys. Chem. Solids 68(5-6), 1074 (2007).
  12. A. A. Burtsev, N. N. Eliseev, V. A. Mikhalevsky, A. V. Kiselev, V. V. Ionin, V. V. Grebenev, D. N. Karimov, and A. A. Lotin, Materials Science in Semiconductor Processing 150, 106907 (2022).
  13. K. Shportko, S. Kremers, M. Woda, D. Lencer, J. Robertson, and M. Wuttig, Nat. Mater. 7(8), 653 (2008).
  14. W. Zhang, R. Mazzarello, M. Wuttig, and E. Ma, Nat. Rev. Mater. 4(3), 150 (2019).

Дополнительные файлы

Доп. файлы
Действие
1. JATS XML

© Российская академия наук, 2024