Josephson Dynamics at High Transmissions: Voltage and Current Bias Limits

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Abstract

We establish a direct relation between the I–V curves for highly transparent Josephson junctions in the voltage- and current-biased regimes. We demonstrate that the presence of sub-Ohmic dissipation at subgap voltages and temperatures yields the linear dependence of the average voltage V¯">V¯ on the bias current I exceeding the critical one Ic">Ic, in contrast to the square root dependence V¯∝I−Ic">V¯∝I−Ic in the Ohmic limit. Our predictions are compared with recent experimental findings.

About the authors

A. V. Galaktionov

Tamm Department of Theoretical Physics, Lebedev Physical Institute, Russian Academy of Sciences

Email: galakt@lpi.ru
119991, Moscow, Russia

A. D. Zaikin

Tamm Department of Theoretical Physics, Lebedev Physical Institute, Russian Academy of Sciences

Author for correspondence.
Email: galakt@lpi.ru
119991, Moscow, Russia

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